time to failure

These computers were designed with extremely long mean times to failure.

Engine time to failure is about three hours, give or take."

The failure of that circuit is measured by mean time to failure.

The calculated mean time to failure of such high reliability systems can be on the order of centuries.

Other tests use a constant load and measure the time to failure or to a critical deflection.

Fixed (Uniform): Defined by a maximum time to failure or repair.

Expected time to failure is ninety-seven seconds!

It describes time to failure for non-repairable components like an integrated circuit soldered on a circuit board.

Nevertheless, time to failure is still longer for amalgam, and it has remained a superior restorative material over resin-base composites, but with poor aesthetic qualities.

Statistical Analysis Time to failure during the different treatment interruptions was assessed by Kaplan-Meier analysis.

OEE Systems - to reduce maintenance response time to failure (RFT)

MTFF and MTTF (mean time to failure) have identical meanings.

In reliability problems, the expected lifetime is called the mean time to failure, and the expected future lifetime is called the mean residual lifetime.

The reliability of such systems can be calculated statistically and is stated as the mean time to failure, which is a variant of mean time between failures.

MTTF (Mean Time To Failure)

A 50% reduction of mean time to failure does not adequately explain why the inner lower boom in VH-RMQ should have failed before reaching its retirement life.

Each coupon test generates a point on the plot though in some cases there is a runout where the time to failure exceeds that available for the test (see censoring).

Vacuum tubes, which could be used for switching, made electronic computing possible for the first time, but the cost and relatively short mean time to failure of tubes were limiting factors.

At the end of the 1960s J. R. Black developed an empirical model to estimate the MTTF (mean time to failure) of a wire, taking electromigration into consideration.

MTBF consisting of mean time to failure (MTTF) and mean time to repair(MTTR).

The mean time to failure (MTTF) or mean time between failures (MTBF) of a RAID system is the same as that of its components.

This is in contrast to the mean time to failure (MTTF), which measures average time to failures with the modeling assumption that the failed system is not repaired (infinite repair rate).

Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.

Service life is different from a predicted life, or MTTF/MTBF (Mean Time to Failure/Mean Time Between Failures)/MFOP (maintenance-free operating period).

However availability optimization approaches provide solutions only at selected points in time (not all times), using mean time to failure (or fixed rate demand) and mean time to repair as deterministic values as part of convex optimization.